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  INSPECTION SYSTEM

 

 

Home > Inspection System > SWIR 검사  

 

 

     

 

 

SWIR 검사시스템

(SWIR INPECTION SYSTEM)

 

InGaAs short wave infrared (SWIR) inspection system deliver 640x512 resolution with extended dynamic range response up to 2.2 micron.

The high resolution SWIR system can be used for a very wide variety of applications including laser beam profiling, semiconductor inspection, hyperspectral imaging, on-line process control, Low-light level imaging, and screening solar cells.


Example: For solar cells screening, defects at early processing stage can be imaged through the bulk silicon thanks to its transparency at wavelengths beyond 1.1 micron.
Cracks, dead or weak responding areas are unveiled on sliced wafers, enabling automatic sorting / selection of the best pieces.
The system finally captures faint electroluminescence (EL) and photoluminescence (PL) emissions from individual photovoltaic cells that are directly proportional to their efficiency.
high resolution SWIR Inspection systems are supplied with state of art SWIR optics which will deliver superior resolution / contrast modulation and lower distortion than conventional NIR optics that are used with conventional CCD cameras.

 

 

적용분야

 

• 솔라셀 검사 (Solar cell inspection)

• 솔라셀용 실리콘웨이퍼 검사 (Bare solar cell silicon wafer inspection)

• 반도체 검사 (Semiconductor inspection)

• 자외선 천문학 분야 (Astronomy)

• 건조로 / 소성로 온도 모니터링 (Temperature furnace monitoring)

• 산업용 열상 이미지 검사 (Industrial thermal imaging)

• 스펙트로스코피 이미징 (Imaging spectroscopy)

• 피부의료분야의 이미징 (Dermatologic imaging)

• 적외선 마이크로스코피 (Thick sample / tissue IR microscopy)

• 레이저 프로파일링 (Laser profiling / telecom)

• Low light level / range gated IR imaging

 

 

 

특징 및 장점 (ADVANTAGES)

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Cooled sensors with 45 and 70 degrees C   delta T, includes hermetically sealed package

10Mhz scanning frequencies

Dynamic range > 1000:1

Low dark current with less than 0.4 pA

Gating time from milliseconds to > 500ns to 1   second

Pixel operability: > 99.5%

Simultaneous integration / readout enabling   100% duty cycle acquisition

Non destructive read out

Spectral range from 0.9 to 1.7 micron

Video CCIR and GigE digital interface

Air cooled / water cooled option

Synchronisation / control : via TTL pulse

Integrated Non Uniformity Correction, bright   pixel, flat field and offset corrections 

 

 

 

 

기술 사양 (SPECIFICATIONS)

  SWIR LR

 SWIR HR

· 320 (h) x 256 (v) InGaAs array

· 640 (h) x 512 (v) InGaAs array

· Input pixel size : 30 x 30 microns

· Input pixel size : 25 x 25 microns

· Input size : 9.6 x 7.68 mm

· Input size: 16 x 12.8 mm

· 25 fps at full resolution @ 10 MHz

· 25 fps at full resolution @ 10 MHz

· Responsitivity in low gain mode: 0.7mV / electron

· Responsitivity in low gain mode: 1.2mV / electron

· Responsitivity in high gain mode: 13.3mV / electron

· Responsitivity in high gain mode: 31mV / electron

· Readout noise : 120 - 150 electrons @ 10 MHz

  with interpolation noise reduction in high gain

  mode, 380 electrons in low gain mode

· Readout noise : 120 - 150 electrons @ 10 MHz  with interpolation noise reduction in high gain  mode, 380 electrons in low gain mode

· Full well capacity : 150,000 electrons in high

  gain mode; 3,000,000 electrons in in low gain

  mode

· Full well capacity : 200,000 electrons in high gain  mode; 3,500,000 electrons in low gain mode

· Sensitivity: 10^10 Jones with 33ms integration

  time @ 1550 nm

· Sensitivity: 10^10 Jones with 33ms integration  time @ 1550 nm

· 16-bit extended dynamic range

· 16-bit extended dynamic range

· Peak QE: >70% @1100nm, > 65% from 1000

  to 1600 nm

· Peak QE: >70%

· Extended QE version up to 2.2 micron available

 

 

 

  

상기 사양은 제품의 성능향상 및 개량을 위하여 변경될 수 있으며, 요청사양은 적용분야에 따라 당사 기술팀과 협의 후 추가 설치 가능하므로, 시스템에 대한 상세한 사양은 당사 영업팀과 상세하게 협의하시기 바랍니다.

 

  

  

 

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경기도 시흥시 정왕천로 197, A-512 (정왕동  동우디지털파크)   |  E-mail : contact@dtx.co.kr  

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FEATURED PRODUCTS

 

 

◎  UV CURING SYSTEM

   ◎   INFRARED DRYING SYSTEM

   ◎  PULSE UV SYSTEM

◎  OPTICAL INSTRUMENTS

   ◎   PHOTONIC SINTERING SYSTEM

   ◎  X-UV SYSTEM

◎  SOLAR SIMULATION SYSTEM

   ◎   WEATHER / FADE TESTING SYSTEM

   ◎  PULSE UV STERILIZATION SYSTEM

◎  XENON IRRADIATION SYSTEM

   ◎   ENGINEERING

   ◎  INSPECTION SYSTEM

◎  LIGHT SOURCE

   ◎   PHOTONIC ACTIVATION SYSTEM